X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

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Authors

  • M. Steffenelli
  • Angelika Riedl
  • T. Müller
  • M. Burghammer

Details

Translated title of the contributionX-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
Original languageEnglish
Pages (from-to)1-8
JournalJournal of applied crystallography
Volume46
DOIs
Publication statusPublished - 2013