X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
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X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison. / Steffenelli, M.; Todt, Juraj; Riedl, Angelika et al.
In: Journal of applied crystallography, Vol. 46, 2013, p. 1-8.
In: Journal of applied crystallography, Vol. 46, 2013, p. 1-8.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Steffenelli, M, Todt, J, Riedl, A, Ecker, W, Müller, T, Daniel, R, Burghammer, M & Keckes, J 2013, 'X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison', Journal of applied crystallography, vol. 46, pp. 1-8. https://doi.org/10.1107/S0021889813019535
APA
Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M., & Keckes, J. (2013). X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison. Journal of applied crystallography, 46, 1-8. https://doi.org/10.1107/S0021889813019535
Vancouver
Steffenelli M, Todt J, Riedl A, Ecker W, Müller T, Daniel R et al. X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison. Journal of applied crystallography. 2013;46:1-8. doi: 10.1107/S0021889813019535
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Bibtex - Download
@article{da07342c6cf44905a4aea4d7b5f15a1a,
title = "X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison",
author = "M. Steffenelli and Juraj Todt and Angelika Riedl and W Ecker and T. M{\"u}ller and Rostislav Daniel and M. Burghammer and Jozef Keckes",
year = "2013",
doi = "10.1107/S0021889813019535",
language = "English",
volume = "46",
pages = "1--8",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
AU - Steffenelli, M.
AU - Todt, Juraj
AU - Riedl, Angelika
AU - Ecker, W
AU - Müller, T.
AU - Daniel, Rostislav
AU - Burghammer, M.
AU - Keckes, Jozef
PY - 2013
Y1 - 2013
U2 - 10.1107/S0021889813019535
DO - 10.1107/S0021889813019535
M3 - Article
VL - 46
SP - 1
EP - 8
JO - Journal of applied crystallography
JF - Journal of applied crystallography
SN - 0021-8898
ER -
