X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

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X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison. / Steffenelli, M.; Todt, Juraj; Riedl, Angelika et al.
In: Journal of applied crystallography, Vol. 46, 2013, p. 1-8.

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@article{da07342c6cf44905a4aea4d7b5f15a1a,
title = "X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison",
author = "M. Steffenelli and Juraj Todt and Angelika Riedl and W Ecker and T. M{\"u}ller and Rostislav Daniel and M. Burghammer and Jozef Keckes",
year = "2013",
doi = "10.1107/S0021889813019535",
language = "English",
volume = "46",
pages = "1--8",
journal = "Journal of applied crystallography",
issn = "0021-8898",
publisher = "International Union of Crystallography",

}

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TY - JOUR

T1 - X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

AU - Steffenelli, M.

AU - Todt, Juraj

AU - Riedl, Angelika

AU - Ecker, W

AU - Müller, T.

AU - Daniel, Rostislav

AU - Burghammer, M.

AU - Keckes, Jozef

PY - 2013

Y1 - 2013

U2 - 10.1107/S0021889813019535

DO - 10.1107/S0021889813019535

M3 - Article

VL - 46

SP - 1

EP - 8

JO - Journal of applied crystallography

JF - Journal of applied crystallography

SN - 0021-8898

ER -