X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Research output: Contribution to journal › Article › Research › peer-review
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- Materials Center Leoben Forschungs GmbH
Details
| Translated title of the contribution | X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films |
|---|---|
| Original language | English |
| Pages (from-to) | 748-751 |
| Journal | Scripta materialia |
| Volume | 67 |
| DOIs | |
| Publication status | Published - 2012 |
