X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
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In: Scripta materialia, Vol. 67, 2012, p. 748-751.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
AU - Keckes, Jozef
AU - Bartosik, Matthias
AU - Daniel, Rostislav
AU - Mitterer, Christian
AU - Maier, Günther Alois
AU - Ecker, W
AU - Vila-Comamala, J.
AU - David, C.
AU - Schoeder, Sebastian
AU - Burghammer, M.
PY - 2012
Y1 - 2012
U2 - 10.1016/j.scriptamat.2012.07.034
DO - 10.1016/j.scriptamat.2012.07.034
M3 - Article
VL - 67
SP - 748
EP - 751
JO - Scripta materialia
JF - Scripta materialia
SN - 1359-6462
ER -