X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films. / Keckes, Jozef; Bartosik, Matthias; Daniel, Rostislav et al.
in: Scripta materialia, Jahrgang 67, 2012, S. 748-751.
in: Scripta materialia, Jahrgang 67, 2012, S. 748-751.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Keckes, J, Bartosik, M, Daniel, R, Mitterer, C, Maier, GA, Ecker, W, Vila-Comamala, J, David, C, Schoeder, S & Burghammer, M 2012, 'X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films', Scripta materialia, Jg. 67, S. 748-751. https://doi.org/10.1016/j.scriptamat.2012.07.034
APA
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S., & Burghammer, M. (2012). X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films. Scripta materialia, 67, 748-751. https://doi.org/10.1016/j.scriptamat.2012.07.034
Vancouver
Keckes J, Bartosik M, Daniel R, Mitterer C, Maier GA, Ecker W et al. X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films. Scripta materialia. 2012;67:748-751. doi: 10.1016/j.scriptamat.2012.07.034
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Bibtex - Download
@article{837be35a0cc7460eaae1a6ae60fc3fd3,
title = "X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films",
author = "Jozef Keckes and Matthias Bartosik and Rostislav Daniel and Christian Mitterer and Maier, {G{\"u}nther Alois} and W Ecker and J. Vila-Comamala and C. David and Sebastian Schoeder and M. Burghammer",
year = "2012",
doi = "10.1016/j.scriptamat.2012.07.034",
language = "English",
volume = "67",
pages = "748--751",
journal = "Scripta materialia",
issn = "1359-6462",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
AU - Keckes, Jozef
AU - Bartosik, Matthias
AU - Daniel, Rostislav
AU - Mitterer, Christian
AU - Maier, Günther Alois
AU - Ecker, W
AU - Vila-Comamala, J.
AU - David, C.
AU - Schoeder, Sebastian
AU - Burghammer, M.
PY - 2012
Y1 - 2012
U2 - 10.1016/j.scriptamat.2012.07.034
DO - 10.1016/j.scriptamat.2012.07.034
M3 - Article
VL - 67
SP - 748
EP - 751
JO - Scripta materialia
JF - Scripta materialia
SN - 1359-6462
ER -
