X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Standard

X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films. / Keckes, Jozef; Bartosik, Matthias; Daniel, Rostislav et al.
in: Scripta materialia, Jahrgang 67, 2012, S. 748-751.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{837be35a0cc7460eaae1a6ae60fc3fd3,
title = "X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films",
author = "Jozef Keckes and Matthias Bartosik and Rostislav Daniel and Christian Mitterer and Maier, {G{\"u}nther Alois} and W Ecker and J. Vila-Comamala and C. David and Sebastian Schoeder and M. Burghammer",
year = "2012",
doi = "10.1016/j.scriptamat.2012.07.034",
language = "English",
volume = "67",
pages = "748--751",
journal = "Scripta materialia",
issn = "1359-6462",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

AU - Keckes, Jozef

AU - Bartosik, Matthias

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Maier, Günther Alois

AU - Ecker, W

AU - Vila-Comamala, J.

AU - David, C.

AU - Schoeder, Sebastian

AU - Burghammer, M.

PY - 2012

Y1 - 2012

U2 - 10.1016/j.scriptamat.2012.07.034

DO - 10.1016/j.scriptamat.2012.07.034

M3 - Article

VL - 67

SP - 748

EP - 751

JO - Scripta materialia

JF - Scripta materialia

SN - 1359-6462

ER -