Nina Schalk
Research output
- E-pub ahead of print
In-situ X-ray diffraction study of the oxidation behavior of arc-evaporated TiAlSiN coatings with low Al contents
Moritz, Y., Saringer, C., Tkadletz, M., Fian, A., Czettl, C., Pohler, M. & Schalk, N., 3 Nov 2023, (E-pub ahead of print) In: Surface & coatings technology. 475.2023, 25 December, 10 p., 130161.Research output: Contribution to journal › Article › Research › peer-review
- Published
Diffusion studies in epitaxial TiN/Cu layers on MgO(001) by high resolution TEM and APT
Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2014.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography
Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2015, In: Thin solid films. 574, p. 103-109Research output: Contribution to journal › Article › Research › peer-review
- Published
Cu diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography
Mühlbacher, M., Mendez Martin, F., Sartory, B., Schalk, N., Keckes, J., Lu, J., Hultman, L. & Mitterer, C., 2014.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Influence of microstructure on diffusion barrier properties of TiN investigated by TEM and APT
Mühlbacher, M., Mendez Martin, F., Sartory, B., Lu, J., Schalk, N., Lars, H. & Mitterer, C., 2014.Research output: Contribution to conference › Presentation › Research › peer-review
- E-pub ahead of print
Cu diffusion in single-crystal and polycrystalline TiN barrier layers: A high-resolution experimental study supported by first-principles calculations
Mühlbacher, M., Bochkarev, A. S., Mendez Martin, F., Sartory, B., Chitu, L., Popov, M., Puschnig, P., Spitaler, J., Ding, H., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 26 Aug 2015, (E-pub ahead of print) In: Journal of applied physics. 118.2015, 8, 085307.Research output: Contribution to journal › Article › Research › peer-review
- Published
TiN diffusion barrier failure by the formation of Cu3Si investigated by electron microscopy and atom probe tomography
Mühlbacher, M., Greczynski, G., Sartory, B., Mendez Martin, F., Schalk, N., Lu, J., Hultman, L. & Mitterer, C., 19 Feb 2016, In: Journal of Vacuum Science and Technology B, JVSTB. 34.2016, 2, p. 1-8 8 p., 022202.Research output: Contribution to journal › Article › Research › peer-review
- Published
Evaluation of TiN diffusion barrier layers with different microstructures by transmission electron microscopy and atom probe tomography
Mühlbacher, M., Mendez Martin, F., Sartory, B., Chitu, L., Lu, J., Schalk, N., Keckes, J., Hultman, L. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations
Mühlbacher, M., Mendez Martin, F., Lu, J., Schalk, N., Hultman, L. & Mitterer, C., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Diffusion Studies in the TiN/Cu Bilayer System and Beyond
Mühlbacher, M., Mendez Martin, F., Sartory, B., Greczynski, G., Lu, J., Schalk, N., Hultman, L. & Mitterer, C., 2016.Research output: Contribution to conference › Presentation › Research › peer-review
