Karl Christian Teichert

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Research output

  1. Published

    Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy

    Kremmer, S., Wurmbauer, H., Andreev, A., Teichert, C., Tallarida, G., Spiga, S., Wiemer, C. & Fanciulli, M., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  2. Published

    Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy

    Andreev, A. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Nanoscale modification of friction properties on HOPG induced by slow highly charged ions.

    Ritter, R., Shen, Q., Kowarik, G., Ginzel, R., Lebius, H., Maunoury, L., Toulemonde, M., Dufour, C., López-Urrutia, J. R. C., Teichert, C. & Aumayr, F., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Nanoscale morphological and electrical homogeneity of HfO2 and ZrO2 thin films

    Teichert, C. & Kremmer, S., 2005, In: Journal of applied physics. 97

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Nanostructure formation on ion eroded SiGe and Si surfaces

    Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Nanostructure formation on ion eroded SiGe and Si surfaces

    Hofer, C. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Nanostructure formation on ion eroded SiGe and Si surfaces

    Hofer, C. & Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  9. Published

    Nanostructure formation on ion eroded SiGe and Si surfaces

    Hofer, C. & Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  10. Published

    Nanostructure formation on ion-eroded SiGe films on Si(001)

    Hofer, C. & Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

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Phone: 4663

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