Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
Research output: Contribution to conference › Poster › Research › peer-review
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| Translated title of the contribution | Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy |
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| Original language | English |
| Publication status | Published - 2006 |
| Event | 14th International Winterschool on New Developments in Solid State Physics - Mauterndorf, Austria Duration: 13 Feb 2006 → 17 Feb 2006 |
Conference
| Conference | 14th International Winterschool on New Developments in Solid State Physics |
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| Country/Territory | Austria |
| City | Mauterndorf |
| Period | 13/02/06 → 17/02/06 |
