Jozef Keckes
Research output
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
Keckes, J., Daniel, R., Bartosik, M., Mitterer, C., Schoeder, S. & Burghammer, M., 2011, Proceeding of International Conference on Metallurgical Coatings and Thin Films. p. 55-55Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
Bartosik, M., Daniel, R., Mitterer, C., Schoeder, S., Burghammer, M. & Keckes, J., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs
Karner, S., Blank, O., Rösch, M., Zalesak, J., Keckes, J. & Gammer, C., 2022, In: Microelectronic engineering. 264.2022, 15 August, 111870.Research output: Contribution to journal › Article › Research › peer-review
- Published
Multi-scale interface design of strong and damage resistant hierarchical nanostructured materials
Daniel, R., Meindlhumer, M., Zalesak, J., Baumegger, W., Todt, J., Ziegelwanger, T., Keckes, J., Mitterer, C. & Keckes, J., Nov 2020, In: Materials and Design. 196, November, p. 1-11 109169.Research output: Contribution to journal › Article › Research › peer-review
- Published
Multimethod cross-sectional characterization approaching the limits of diamond monophase multilayers
Meindlhumer, M., Grau, J., Sternschulte, H., Halahovets, Y., Siffalovic, P., Burghammer, M., Steinmüller-Nethl, D. & Keckes, J., 13 May 2024, In: Materials characterization. 212.2024, June, 15 p., 113973.Research output: Contribution to journal › Article › Research › peer-review
- Published
Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
Daniel, R., Jäger, E., Todt, J., Sartory, B., Mitterer, C. & Keckes, J., 28 May 2014, In: Journal of applied physics. 115, 20, 203507.Research output: Contribution to journal › Article › Research › peer-review
- Published
Modification of wetting of copper (Cu) on carbon (C) by plasma treatment and molybdenum (Mo)interlayers
Eisenmenger-Sittner, C., Schrank, C., Neubauer, E., Eiper, E. & Keckes, J., 2006, In: Applied surface science. 252, p. 5343-5346Research output: Contribution to journal › Article › Research › peer-review
- Published
Micro tensile tests: New insights based on µDiffraction
Kirchlechner, C., Motz, C., Grosinger, W., Labat, S., Perroud, O., Thomas, O., Micha, J.-S., Ulrich, O., Dehm, G. & Keckes, J., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Microstructure related stress state in magnetron sputtered thin films
Daniel, R., Martinschitz, K., Keckes, J. & Mitterer, C., 2009, Proceedings E-MRS Spring Meeting. p. 25-25Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
