Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Research output: Contribution to conference › Poster › Research › peer-review
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| Translated title of the contribution | Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films |
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| Original language | English |
| Publication status | Published - 2010 |
| Event | Applications of X-ray Analysis - Denver, United States Duration: 2 Oct 2010 → 6 Oct 2010 |
Conference
| Conference | Applications of X-ray Analysis |
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| Country/Territory | United States |
| City | Denver |
| Period | 2/10/10 → 6/10/10 |
