Jozef Keckes
Research output
- Published
µLaue: Compression studies on miniaturised Copper single crystals
Kirchlechner, C., Kapp, M., Motz, C., Grosinger, W., Keckes, J., Micha, J.-S., Ulrich, O. & Dehm, G., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Zukunftsfonds Land Steiermark, Projekt Nr. 119
Eiper, E., Keckes, J. & Pippan, R., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Zerstörungsfreie Charakterisierung von Furnieren für strukturelle Verbundwerkstoffe: Evaluierung von Methoden und Einflussfaktoren Maximilian
Pramreiter, M., Bodner, S. C., Keckes, J., Stadlmann, A., Konnerth, J., Feist, F., Baumann, G., Huber, C. & Müller, U., 2021, In: Holztechnologie. 62.2021, 1, p. 5-18 13 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors
Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods
Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8Research output: Contribution to journal › Article › Research › peer-review
