Jozef Keckes
Research output
- Published
In-situ Synchrotron Studies of Structural Changes in Wood during Microtensile Tests
Keckes, J., Burgert, I., Müller, M., Kölln, K., Hamilton, M., Burghammer, M., Roth, S. V., Stanzl-Tschegg, S. & Fratzl, P., 2004, Proceedings of the 2nd International Symposium on Wood Machining. BOKU - Univ. of Natural Resources [u.a.], p. 37-44Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
In-situ WAXS studies of structural changes in wood foils and in individual wood cells during microtrensile tests
Keckes, J., Burgert, I., Müller, M., Kölln, K., Hamilton, M., Burghammer, M., Roth, S. V., Stanzl-Tschegg, S. E. & Fratzl, P., 2005, In: Fibre diffraction review. p. 48-51Research output: Contribution to journal › Article › Research › peer-review
- Published
Simultaneous determination of experimental elastic and thermal strains in thin films
Keckes, J., 2005, In: Journal of applied crystallography. 38, p. 311-318Research output: Contribution to journal › Article › Research › peer-review
- Published
In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale
Keckes, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W. & Dehm, G., 2006, In: Advanced engineering materials. p. 1084-1088Research output: Contribution to journal › Article › Research › peer-review
- Published
Temperature dependence of in-plane stresses in sublayers of Al/AlN/Al2O3(0 0 0 1) structure
Keckes, J., Six, S., Gerlach, J. W. & Rauschenbach, B., 2004, In: Journal of crystal growth. 262, p. 119-123Research output: Contribution to journal › Article › Research › peer-review
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Structural changes in cyclically deformed cellulosics characterized by in situ synchrotron X-ray diffraction coupled with tensile tests
Keckes, J., Boesecke, P. & Gindl, W., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Eigenspannungs-Charakterisierung mittels Röntgendiffraktometrie
Keckes, J. & Eiper, E., 2005, Handbuch der Nanoanalytik. p. 147-149Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
Keckes, J., Daniel, R., Bartosik, M., Mitterer, C., Schoeder, S. & Burghammer, M., 2011, Proceeding of International Conference on Metallurgical Coatings and Thin Films. p. 55-55Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method
Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R. & Mitterer, C., 2007, In: Review of scientific instruments. 78, p. 036103-01-036103-03Research output: Contribution to journal › Article › Research › peer-review
