In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • Ernst Eiper
  • Klaus Jürgen Martinschitz
  • P. Boesecke
  • Wolfgang Gindl

Organisational units

Details

Translated title of the contributionIn situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale
Original languageEnglish
Pages (from-to)1084-1088
Journal Advanced engineering materials
Publication statusPublished - 2006