In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale
Research output: Contribution to journal › Article › Research › peer-review
Standard
In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. / Keckes, Jozef; Eiper, Ernst; Martinschitz, Klaus Jürgen et al.
In: Advanced engineering materials, 2006, p. 1084-1088.
In: Advanced engineering materials, 2006, p. 1084-1088.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Keckes, J, Eiper, E, Martinschitz, KJ, Boesecke, P, Gindl, W & Dehm, G 2006, 'In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale', Advanced engineering materials, pp. 1084-1088.
APA
Keckes, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W., & Dehm, G. (2006). In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced engineering materials, 1084-1088.
Vancouver
Keckes J, Eiper E, Martinschitz KJ, Boesecke P, Gindl W, Dehm G. In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced engineering materials. 2006;1084-1088.
Author
Bibtex - Download
@article{ee811a5b739745d4a1762673819e9a6f,
title = "In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale",
author = "Jozef Keckes and Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and P. Boesecke and Wolfgang Gindl and Gerhard Dehm",
year = "2006",
language = "English",
pages = "1084--1088",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale
AU - Keckes, Jozef
AU - Eiper, Ernst
AU - Martinschitz, Klaus Jürgen
AU - Boesecke, P.
AU - Gindl, Wolfgang
AU - Dehm, Gerhard
PY - 2006
Y1 - 2006
M3 - Article
SP - 1084
EP - 1088
JO - Advanced engineering materials
JF - Advanced engineering materials
SN - 1438-1656
ER -
