In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

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In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. / Keckes, Jozef; Eiper, Ernst; Martinschitz, Klaus Jürgen et al.
in: Advanced engineering materials, 2006, S. 1084-1088.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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@article{ee811a5b739745d4a1762673819e9a6f,
title = "In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale",
author = "Jozef Keckes and Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and P. Boesecke and Wolfgang Gindl and Gerhard Dehm",
year = "2006",
language = "English",
pages = "1084--1088",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

AU - Keckes, Jozef

AU - Eiper, Ernst

AU - Martinschitz, Klaus Jürgen

AU - Boesecke, P.

AU - Gindl, Wolfgang

AU - Dehm, Gerhard

PY - 2006

Y1 - 2006

M3 - Article

SP - 1084

EP - 1088

JO - Advanced engineering materials

JF - Advanced engineering materials

SN - 1438-1656

ER -