Jozef Keckes
311 - 318 out of 318Page size: 10
Research output
- Published
Nano-machining for advanced X-ray crystal optics
Záprazný, Z., Korytár, D., Jergel, M., Šiffalovič, P., Halahovets, Y., Keckes, J., Matko, I., Ferrari, C., Vagovič, P. & Mikloška, M., 2016.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Resolving depth evolution of microstructure and hardness in sputtered CrN film
Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79Research output: Contribution to journal › Article › Research › peer-review
- Published
Mechanical property enhancement in laminates through control of morphology and crystal orientation
Zeilinger, A., Daniel, R., Stefenelli, M., Sartory, B., Chitu, L., Burghammer, M., Schöberl, T., Kolednik, O., Keckes, J. & Mitterer, C., 2015, In: Journal of physics / D, Applied physics. 48, p. 2953031-2953039Research output: Contribution to journal › Article › Research › peer-review
- Published
In-situ Observation of Cross- Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation
Zeilinger, A., Todt, J., Krywka, C., Müller, M., Ecker, W., Sartory, B., Meindlhumer, M., Stefenelli, M., Daniel, R., Mitterer, C. & Keckes, J., 7 Mar 2016, In: Scientific reports (London : Nature Publishing Group). 6:22670, p. 1-14 14 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Extraordinary high-temperature behavior of electrically conductive Hf7B23Si22C6N40 ceramic film
Zeman, P., Zuzjaková, Čerstvý, R., Houška, J., Shen, Y., Todt, J., Jiang, J., Daniel, R., Keckes, J., Meletis, E. I. & Vlček, J., 15 Jun 2020, In: Surface and Coatings Technology. 391.2020, 15 June, 8 p., 125686.Research output: Contribution to journal › Article › Research › peer-review
- Published
Backside metallization affects residual stress and bending strength of the recast layer in laser-diced Si
Ziegelwanger, T., Reisinger, M., Matoy, K., Medjahed, A. A., Zalesak, J., Gruber, M., Meindlhumer, M. & Keckes, J., Oct 2024, In: Materials Science in Semiconductor Processing. 181, 108579.Research output: Contribution to journal › Article › Research › peer-review
- Published
Local gradients of microstructure and residual stresses in Si device sidewalls separated by laser dicing
Ziegelwanger, T., Meindlhumer, M., Todt, J., Reisinger, M., Matoy, K. & Keckes, J., 24 Apr 2023.Research output: Contribution to conference › Poster › Research
- Published
20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates
Ziegelwanger, T., Reisinger, M., Vedad, B., Hlushko, K., Van Petegem, S., Todt, J., Meindlhumer, M. & Keckes, J., 31 Jan 2025, In: Materials and Design. 251.2025, March, 9 p., 113664.Research output: Contribution to journal › Article › Research › peer-review
