Igor Beinik
(Former)
Research output
- Published
Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm
Beinik, I. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films
Pedarnig, J. D., Siraj, K., Bodea, M. A., Puica, I., Lang, W., Kolarova, R., Bauer, P., Haselgrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2010, In: Thin solid films. 518, p. 7075-7080Research output: Contribution to journal › Article › Research › peer-review
- Published
Spectroscopy of Defects in Epitaxially Grown Para-sexiphenyl Nanostructures
Kadashchuk, A., Skryshevski, Y., Beinik, I., Teichert, C., Hernandez-Sosa, G., Sitter, H., Andreev, A., Frank, P. & Winkler, A., 2009, EMRS Symposium O. p. 121-125Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Spectroscopy of defects in epitaxially grown para-sexiphenyl nanostructures
Kadashchuk, A., Schols, S., Skryshevski, Y., Beinik, I., Teichert, C., Hernandez-Sosa, G., Sitter, H., Andreev, A., Frank, P. & Winkler, A., 2009, Interface Controlled Organic Thin Films. p. 121-125 (Springer proceedings in physics; vol. 129).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Tejedor, P., Vázquez, L., Díez-Merino, L., Beinik, I. & Teichert, C., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Scanning Probe Microscopy-based Characterization of ZnO Nanorods
Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Photoresponse from single upright standing ZnO nanorods explored by photoconductive atomic force microscopy
Beinik, I., Kratzer, M., Teichert, C., Wachauer, A., Wang, L., Pyriatinsky, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurisic, A., 2013, In: Beilstein journal of nanotechnology . 4, p. 208-217Research output: Contribution to journal › Article › Research › peer-review
- Published
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Piryatinski, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F., Djurišić, A. B. & Teichert, C., 17 Apr 2013, In: Beilstein journal of nanotechnology. 4, 1, p. 208-217 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Origin of the low-energy emission band in epitaxially grown para-sexiphenyl nanocrystallites
Kadashchuk, A., Schols, S., Heremans, P., Skryshevski, Y., Piryantinski, Y., Beinik, I., Teichert, C., Hernandez-Sosa, G., Sitter, H., Andreev, A., Frank, P. & Winkler, A., 2009, In: Journal of chemical physics (The journal of chemical physics). 130, p. 084901-1-084901-9Research output: Contribution to journal › Article › Research › peer-review
- Published
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10Research output: Contribution to journal › Article › Research › peer-review
