Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz
Research output: Contribution to conference › Poster › Research › peer-review
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| Translated title of the contribution | Spatially resolved electrical characterization of InAs and InGaAs nanostructures by Conductive-AFM and Kelvin probe microscopz |
|---|---|
| Original language | English |
| Publication status | Published - 2008 |
| Event | Intel European Research and Innovation Conference - Leixlip, Ireland Duration: 10 Sept 2008 → 12 Sept 2008 |
Conference
| Conference | Intel European Research and Innovation Conference |
|---|---|
| Country/Territory | Ireland |
| City | Leixlip |
| Period | 10/09/08 → 12/09/08 |
