Department Physics, Mechanics and Electrical Engineering
Organisational unit: Departments and Institutes
Research output
- Published
Beyond CMOS: towards semiconductor based quantum information processing
Brunner, R., 2013Research output: Thesis › Habilitation thesis › peer-review
- Published
Residual stress and microstructure evolution in steel tubes for different cooling conditions – Simulation and verification
Brunbauer, S., Winter, G., Antretter, T., Staron, P. & Ecker, W., 2019, In: Materials science and engineering: A, Structural materials: properties, microstructure and processing. 747, p. 73-79Research output: Contribution to journal › Article › Research › peer-review
- Published
Thermal emissivity of carbon coated p-doped silicon stencil masks for ion projection lithography
Braun, D., Gajic, R., Kuchar, F., Korntner, R., Haugeneder, E., Löschner, H., Butschke, J., Letzkus, F. & Springer, R., 2003, In: Journal of vacuum science & technology / B (JVST). 21, p. 123-126Research output: Contribution to journal › Article › Research › peer-review
- Published
Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H. & Djurisic, A. B., 2007, In: Nanotechnology. 18, p. 195301-1-195301-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical monitoring of organic crystal phase transition using MoS2 field effect transistor
Boulet, I., Pascal, S., Bedu, F., Ozerov, I., Ranguis, A., Leoni, T., Becker, C., Masson, L., Matkovic, A., Teichert, C., Siri, O., Attaccalite, C., Huntzinger, J. R., Paillet, M., Zahab, A. & Parret, R., 14 Feb 2023, In: Nanoscale advances. 5.2023, 6, p. 1681-1690 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Erstellung eines Konzepts zur Modularisierung elektrischer Stromlaufpläne von Schienenfahrzeugen
Bonecker, S., 2021Research output: Thesis › Master's Thesis
- Published
Role of elastic strain energy in spheroidal precipitates revisited
Böhm, H. J., Zickler, G., Fischer, F.-D. & Svoboda, J., Apr 2021, In: Mechanics of materials. 155, April, 6 p., 103781.Research output: Contribution to journal › Article › Research › peer-review