Department Physics, Mechanics and Electrical Engineering

Organisational unit: Departments and Institutes

Research output

  1. Published

    Beyond CMOS: towards semiconductor based quantum information processing

    Brunner, R., 2013

    Research output: ThesisHabilitation thesispeer-review

  2. Published
  3. Published

    Thermal emissivity of carbon coated p-doped silicon stencil masks for ion projection lithography

    Braun, D., Gajic, R., Kuchar, F., Korntner, R., Haugeneder, E., Löschner, H., Butschke, J., Letzkus, F. & Springer, R., 2003, In: Journal of vacuum science & technology / B (JVST). 21, p. 123-126

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

    Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H. & Djurisic, A. B., 2007, In: Nanotechnology. 18, p. 195301-1-195301-8

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

    Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods

    Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy

    Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    Electrical monitoring of organic crystal phase transition using MoS2 field effect transistor

    Boulet, I., Pascal, S., Bedu, F., Ozerov, I., Ranguis, A., Leoni, T., Becker, C., Masson, L., Matkovic, A., Teichert, C., Siri, O., Attaccalite, C., Huntzinger, J. R., Paillet, M., Zahab, A. & Parret, R., 14 Feb 2023, In: Nanoscale advances. 5.2023, 6, p. 1681-1690 10 p.

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published
  10. Published

    Role of elastic strain energy in spheroidal precipitates revisited

    Böhm, H. J., Zickler, G., Fischer, F.-D. & Svoboda, J., Apr 2021, In: Mechanics of materials. 155, April, 6 p., 103781.

    Research output: Contribution to journalArticleResearchpeer-review