Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
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| Translated title of the contribution | Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies |
|---|---|
| Original language | English |
| Pages (from-to) | 3342-3351 |
| Journal | Applied surface science |
| Volume | 252 |
| DOIs | |
| Publication status | Published - 2006 |
