Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351

Research output: Contribution to journal › Article › Research › peer-review

Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy

Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8

Research output: Contribution to journal › Article › Research › peer-review

Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods

Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560

Research output: Contribution to journal › Article › Research › peer-review

Thermal emissivity of carbon coated p-doped silicon stencil masks for ion projection lithography

Braun, D., Gajic, R., Kuchar, F., Korntner, R., Haugeneder, E., Löschner, H., Butschke, J., Letzkus, F. & Springer, R., 2003, In: Journal of vacuum science & technology / B (JVST). 21, p. 123-126

Research output: Contribution to journal › Article › Research › peer-review

Draining of the sea of chaos: Role of resonant transmission and reflection in an array of billiards

Brunner, R., Meisels, R., Kuchar, F., Akis, R., Ferry, D. K. & Bird, J., 2007, In: Physical review letters. 98, p. 204101-1-204101-4

Research output: Contribution to journal › Article › Research › peer-review