Publikationen

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2012
Veröffentlicht
TEM characterization of CrN thin films epitaxially grown on MgO (001)
Harzer, T. P., Kormout, K., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Thermally treated hard coatings characterized by XRD coupled with four-point bending
Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, in: Scripta materialia. 67, S. 748-751
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
2011
Veröffentlicht
Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Zhang, Z., Daniel, R. & Mitterer, C., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Atomic and electronic structures of a transition layer at the CrN/Cr interface
Zhang, Z., Daniel, R. & Mitterer, C., 2011, in: Journal of applied physics. 110, S. 043524-1-043524-4
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Comparative studies of the CrN-Cr-Si an d CrN-Si interfaces by Cs-corrected HRTEM and STEM-EELS
Zhang, Z., Daniel, R. & Mitterer, C., 2011, Proceeding of Multinational Congress on Microscopy. S. 29-30
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Veröffentlicht
Comparative studies of the CrN-Cr-Si an d CrN-Si interfaces by Cs-corrected HRTEM and STEM-EELS
Zhang, Z., Daniel, R. & Mitterer, C., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Concept for optimized coating design and architecture
Daniel, R. & Mitterer, C., 2011, Abstract International conference on Potential and Applications of Thin Ceramic and Metal Coatings. S. 37-40
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Veröffentlicht
Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
Bartosik, M., Daniel, R., Mitterer, C., Schoeder, S., Burghammer, M. & Keckes, J., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

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Forschungsportal

Publikationen

TEM characterization of CrN thin films epitaxially grown on MgO (001)

Thermally treated hard coatings characterized by XRD coupled with four-point bending

X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM

Atomic and electronic structures of a transition layer at the CrN/Cr interface

Comparative studies of the CrN-Cr-Si an d CrN-Si interfaces by Cs-corrected HRTEM and STEM-EELS

Comparative studies of the CrN-Cr-Si an d CrN-Si interfaces by Cs-corrected HRTEM and STEM-EELS

Concept for optimized coating design and architecture

Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

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