Optimizing surfactant removal from a soft-templated ordered mesoporous carbon precursor: an in situ SAXS study

Rauscher, M., Seyffertitz, M., Kohns, R., Stock, S., Amenitsch, H., Huesing, N. & Paris, O., 2 Mai 2023, in: Journal of applied crystallography. 56.2023, 3, S. 801-809 8 S.

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Characterization of anisotropic pores and spatially oriented precipitates in sintered Mo-base alloys using small-angle neutron scattering

Karge, L., Lang, D., Schatte, J., Gilles, R., Busch, S., Leibenguth, P., Clemens, H. & Petry, W., 2018, in: Journal of applied crystallography. 51.2018, S. 1706-1714 9 S.

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Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes

Schoderböck, P., Leibenguth, P. & Tkadletz, M., Aug. 2017, in: Journal of applied crystallography. 50.2017, 4, S. 1011-1020 10 S.

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Quantifying adsorption-induced deformation of nanoporous materials on different length scales

Morak, R., Braxmeier, S., Ludescher, L., Putz, F., Busch, S., Hüsing, N., Reichenauer, G. & Paris, O., 2017, in: Journal of applied crystallography. 50.2017, S. 1404-1410 7 S., 5.

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A novel high-throughput setup for in situ powder diffraction on coin cell batteries

Herklotz, M., Weiß, J., Ahrens, E., Yavuz, M., Mereacre, L., Kiziltas-Yavuz, N., Dräger, C., Ehrenberg, H., Eckert, J., Fauth, F., Giebeler, L. & Knapp, M., 1 Feb. 2016, in: Journal of applied crystallography. 49.2016, 1, S. 340-345 6 S.

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Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

Zalesak, J., Todt, J., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Burghammer, M., Daniel, R. & Keckes, J., 2016, in: Journal of applied crystallography. 49, 6, S. 2217-2225 9 S.

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Pore Shape and Sorption Behaviour in Mesoporous Ordered Silica Films

Popovski, G., Morak, R., Sharifi Rajabi, P., Amenitsch, H. & Paris, O., 2016, in: Journal of applied crystallography. 49, S. 1713-1720

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X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, in: Journal of applied crystallography. 49, S. 182-187 6 S.

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Considerations on the model-free shape retrieval of inorganic nanocrystals from small-angle scattering data

Burian, M., Fritz-Popovski, G., He, M., Kovalenko, M. V., Paris, O. & Lechner, R. T., Juni 2015, in: Journal of applied crystallography. 48, S. 857-868

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Interpretation of two-dimensional real-space functions obtained from small-angle scattering data of oriented microstructures

Fritz-Popovski, G., 2015, in: Journal of applied crystallography. 48, S. 44-51

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A customizable software for fast reduction and analysis of large X-ray scattering data sets: applications of the new DPDAK package to small-angle X-ray scattering and grazing-incidence small-angle X-ray scattering

Benecke, G., Wagermaier, W., Li, C., Schwartzkopf, M., Flucke, G., Hoerth, R., Zizak, I., Burghammer, M., Metwalli, E., Müller-Buschbaum, P., Trebbin, M., Foerster, S., Paris, O., Roth, S. V. & Fratzl, P., Okt. 2014, in: Journal of applied crystallography. 47, S. 1797-1803

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Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer

Benediktovitch, A. I., Ulyanenkova, T., Keckes, J. & Ulyanenkov, A. P., 2014, in: Journal of applied crystallography. S. 1931-938

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Two-dimensional indirect Fourier transformation for evaluation of small-angle scattering data of oriented samples

Fritz-Popovski, G., 2013, in: Journal of applied crystallography. 46, S. 1447-1454

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X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, in: Journal of applied crystallography. 46, S. 1-8

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Apparent lattice expansion in ordered nanoporous silica during capillary condensation of fluids

Prass, J., Müter, D., Erko, M. & Paris, O., 2012, in: Journal of applied crystallography. 45, S. 798-806

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A two-dimensional waveguide beam for X-ray nanodiffraction

Krywka, C., Neubauer, H., Priebe, M., Salditt, T., Keckes, J., Buffet, A., Roth, S. V., Doehrmann, R. & Mueller, M., 2012, in: Journal of applied crystallography. 45.20212 , Part 1, S. 85-92 8 S.

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In-situ small-angle neutron scattering study of pore filling and pore emptying in ordered mesoporous silica

Erko, M., Wallacher, D., Brandt, A. & Paris, O., 2010, in: Journal of applied crystallography. 43, S. 1-7

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Scanning small-angle X-ray scattering analysis of the size and organization of the mineral nanoparticles in fluorotic bone using a stack of cards model

Gourrier, A., Li, C., Siegel, S., Paris, O., Roschger, P., Klaushofer, K. & Fratzl, P., 2010, in: Journal of applied crystallography. 43, S. 1385-1392

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Elastic constants of fibre-textured thin films determined by X-ray diffraction

Martinschitz, K. J., Daniel, R., Mitterer, C. & Keckes, J., 2009, in: Journal of applied crystallography. 42, S. 1-13

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Fracture of poly(vinylidene fluoride): a combined synchrotron and laboratory in-situ X-ray scattering study

Maier, G. A., Wallner, G., Lang, R., Keckes, J., Amentisch, H. & Fratzl, P., 2007, in: Journal of applied crystallography. 40, Supplement April, S. s564-s567

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