The new two-dimensional indirect Fourier transformation converts small-angle scattering patterns obtained by means of area detectors into two-dimensional real-space functions. These functions contain identical information to the scattering patterns, but many parameters related to the microstructure can be obtained directly from them. The size and shape of the microstructures are mainly reflected in the contours of the real-space functions. Their height can be used to get information on the internal architecture of the microstructures. The principles are demonstrated on nanostructured silica biotemplated by spruce wood.