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  1. Published

    µLaue: Compression studies on miniaturised Copper single crystals

    Kirchlechner, C., Kapp, M., Motz, C., Grosinger, W., Keckes, J., Micha, J.-S., Ulrich, O. & Dehm, G., 2011.

    Research output: Contribution to conference › Poster › Research › peer-review

  2. Published

    Zukunftsfonds Land Steiermark, Projekt Nr. 119

    Eiper, E., Keckes, J. & Pippan, R., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  3. Published

    Zerstörungsfreie Charakterisierung von Furnieren für strukturelle Verbundwerkstoffe: Evaluierung von Methoden und Einflussfaktoren Maximilian

    Pramreiter, M., Bodner, S. C., Keckes, J., Stadlmann, A., Konnerth, J., Feist, F., Baumann, G., Huber, C. & Müller, U., 2021, In: Holztechnologie. 62.2021, 1, p. 5-18 13 p.

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

    Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31

    Research output: Contribution to journal › Article › Research › peer-review

  5. Published

    X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

    Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journal › Article › Research › peer-review

  7. E-pub ahead of print

    X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors

    Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods

    Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel

    Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journal › Article › Research › peer-review

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