Research output

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2010
Published
Combined structure-factor phase measurement and theoretical calculations for mapping of chemical bonds in GaN
Jiang, B., Zuo, J. M., Holec, D., Humphreys, C. J., Spackman, M. & Spence, C. H., 2010, In: Acta crystallographica / A (Section A, Foundations of crystallography). p. 446-450
Research output: Contribution to journal › Article › Research › peer-review
Published
Development of intrinsic and thermal components of residual stress in nanostructured thin films: Grain size dependent phenomena
Daniel, R., Keckes, J. & Mitterer, C., 2010, Proceedings 8th European Conference on Residual Stresses. p. 15-15
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Published
Effect of Grain Size on the Residual Stress State and Thermal Expansion in Magnetron Sputtered Thin Films
Daniel, R., Holec, D., Keckes, J. & Mitterer, C., 2010, Proceedings 37th International Conference on Metallurgical Coatings and Thin Films. p. 63-63
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Published
Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
Bennett, S. E., Holec, D., Kappers, M. J., Humphreys, C. J. & Oliver, R. A., 2010, In: Review of scientific instruments. p. 0637011-0637017
Research output: Contribution to journal › Article › Research › peer-review
Published
In situ μLaue tensile tests on micron sized Cu single crystals
Kirchlechner, C., Imrich, P., Grosinger, W., Kapp, M., Motz, C., Keckes, J. & Dehm, G., 2010.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Influence of Nb on the phase stability of Ti-Al-N
Mayrhofer, P. H., Rachbauer, R. & Holec, D., 2010, In: Scripta materialia. 63, p. 807-810
Research output: Contribution to journal › Article › Research › peer-review
Published
Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Vaxelaire, N., Proudhon, H., Labat, S., Kirchlechner, C., Keckes, J., Jaques, V., Ravy, S., Forest, S. & Thomas, O., 2010, In: New journal of physics. p. 1-12
Research output: Contribution to journal › Article › Research › peer-review
Published
Modelling of stresses in polycrystalline materials: The origin and redistribution of stresses in NiTi
Holec, D., 2010
Research output: Book/Report › Book › Research
Published
Multi-scale modelling of III-nitrides:Selected topics from dislocations to the electronic structure
Holec, D., 2010
Research output: Book/Report › Book › Research
Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.
Research output: Contribution to conference › Poster › Research › peer-review

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Research Portal

Research output

Combined structure-factor phase measurement and theoretical calculations for mapping of chemical bonds in GaN

Development of intrinsic and thermal components of residual stress in nanostructured thin films: Grain size dependent phenomena

Effect of Grain Size on the Residual Stress State and Thermal Expansion in Magnetron Sputtered Thin Films

Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

In situ μLaue tensile tests on micron sized Cu single crystals

Influence of Nb on the phase stability of Ti-Al-N

Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Modelling of stresses in polycrystalline materials: The origin and redistribution of stresses in NiTi

Multi-scale modelling of III-nitrides:Selected topics from dislocations to the electronic structure

Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

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