Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
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| Translated title of the contribution | Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction |
|---|---|
| Original language | English |
| Pages (from-to) | 1-12 |
| Journal | New journal of physics |
| Publication status | Published - 2010 |
