Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

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Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. / Vaxelaire, N.; Proudhon, H.; Labat, S. et al.
In: New journal of physics, 2010, p. 1-12.

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@article{bf615004b49d4aeab13d6d05f7e74948,
title = "Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction",
author = "N. Vaxelaire and H. Proudhon and S. Labat and Christoph Kirchlechner and Jozef Keckes and V. Jaques and S. Ravy and S. Forest and O. Thomas",
year = "2010",
language = "English",
pages = "1--12",
journal = "New journal of physics",
issn = "1367-2630",
publisher = "IOP Publishing Ltd.",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

AU - Vaxelaire, N.

AU - Proudhon, H.

AU - Labat, S.

AU - Kirchlechner, Christoph

AU - Keckes, Jozef

AU - Jaques, V.

AU - Ravy, S.

AU - Forest, S.

AU - Thomas, O.

PY - 2010

Y1 - 2010

M3 - Article

SP - 1

EP - 12

JO - New journal of physics

JF - New journal of physics

SN - 1367-2630

ER -