Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
Research output: Contribution to journal › Article › Research › peer-review
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| Translated title of the contribution | Imaging dislocations in gallium nitride across broad areas using atomic force microscopy |
|---|---|
| Original language | English |
| Pages (from-to) | 0637011-0637017 |
| Journal | Review of scientific instruments |
| DOIs | |
| Publication status | Published - 2010 |
