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2010
Published
Low friction CrNMPP/TiNDCMS multilayer coatings
Paulitsch, J., Maringer, C. & Mayrhofer, P. H., 2010.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Vaxelaire, N., Proudhon, H., Labat, S., Kirchlechner, C., Keckes, J., Jaques, V., Ravy, S., Forest, S. & Thomas, O., 2010, In: New journal of physics. p. 1-12
Research output: Contribution to journal › Article › Research › peer-review
Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Phase stability and decomposition products of Ti-Al-Ta-N thin films
Rachbauer, R., Holec, D. & Mayrhofer, P. H., 2010, In: Applied physics letters. 97, p. 151901-1-151901-3
Research output: Contribution to journal › Article › Research › peer-review
Published
Pressure dependent stability of cubic and wurtzite phases within the TiN-AIN and CrN-AIN systems
Holec, D., Rovere, F., Mayrhofer, P. H. & Barna, P. B., 2010.
Research output: Contribution to conference › Poster › Research › peer-review
Published
Pressure-dependent stability of cubic and wurtzite phases within the TiN-AIN and CrN-AIN systems
Holec, D., Rovere, F., Mayrhofer, P. H. & Barna, P. B., 2010, In: Scripta materialia. 62, p. 349-352
Research output: Contribution to journal › Article › Research › peer-review
Published
Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Klaus, M., Genzel, C., Mitterer, C. & Keckes, J., 2010, In: Thin solid films. 518, 8, p. 2090-2096
Research output: Contribution to journal › Article › Research › peer-review
Published
Review: current international research into cellulose nanofibres and nanocomposites
Keckes, J., Eichhorn, S. J., Dufresne, A., Aranguren, M., Marcovich, N. E., Capadona, J. R., Rowan, S. J., Weder, C., Thielemans, W., Roman, M., Renneckar, S., Gindl, W., Veigel, S., Yano, H., Abe, K., Nogi, M. & Nakagaito, A. N., 2010, In: Journal of materials science. p. 1-33
Research output: Contribution to journal › Article › Research › peer-review
Published
Structure and properties of high power impulse magnetron sputtering and DC magnetron sputtering CrN and TiN films deposited in an industrial scale unit
Paulitsch, J., Schenkel, M., Zufraß, T., Mayrhofer, P. H. & Münz, W-D., 2010, In: Thin solid films. 518, p. 5558-5564
Research output: Contribution to journal › Article › Research › peer-review
Published
Structure and stability of phases within the NbN-AIN system
Holec, D., Franz, R., Mayrhofer, P. H. & Mitterer, C., 2010, In: Journal of physics / D, Applied physics. 43, p. 145403-145411
Research output: Contribution to journal › Article › Research › peer-review

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Research Portal

Research output

Low friction CrNMPP/TiNDCMS multilayer coatings

Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

Phase stability and decomposition products of Ti-Al-Ta-N thin films

Pressure dependent stability of cubic and wurtzite phases within the TiN-AIN and CrN-AIN systems

Pressure-dependent stability of cubic and wurtzite phases within the TiN-AIN and CrN-AIN systems

Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction

Review: current international research into cellulose nanofibres and nanocomposites

Structure and properties of high power impulse magnetron sputtering and DC magnetron sputtering CrN and TiN films deposited in an industrial scale unit

Structure and stability of phases within the NbN-AIN system

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