Film thickness dependent microstructural changes of thick copper metallizations upon thermal fatigue

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Film thickness dependent microstructural changes of thick copper metallizations upon thermal fatigue. / Bigl, Stephan; Trost, Claus Othmar Wolfgang; Wurster, Stefan et al.
In: Journal of materials research (JMR), Vol. 32.2017, No. 11, 01.06.2017, p. 2022-2034.

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@article{846321e4e74f41c284427b5e03144efb,
title = "Film thickness dependent microstructural changes of thick copper metallizations upon thermal fatigue",
abstract = "With increasing performance requirements in power electronics, the necessity has emerged to investigate the thermo-mechanical behavior of thick Cu metallizations (≥5 μm). Cu films on rigid substrates in the range of 5-20 μm were thermally cycled between 170 and 400 °C by a fast laser device. Compared to the initial microstructures, a texture transition toward the {100} out-of-plane orientation with increasing film thickness was observed during thermo-mechanical cycling, along with an abnormal grain growth in the {100}-oriented grains and a gradual development of substructures in a crystallographic arrangement. Compared to the well-studied thin Cu film counterparts (≤5 μm), the surface damage showed a 1/h f dependency. Transition from an orientation independent (h f = 5 μm) to an orientation specific thermo-mechanical fatigue damage (h f = 10, 20 μm) was observed following a higher damager tolerance in {100} oriented grains.",
keywords = "fatigue, texture, thermal stresses",
author = "Stephan Bigl and Trost, {Claus Othmar Wolfgang} and Stefan Wurster and Cordill, {Megan J.} and Daniel Kiener",
year = "2017",
month = jun,
day = "1",
doi = "10.1557/jmr.2017.199",
language = "English",
volume = "32.2017",
pages = "2022--2034",
journal = "Journal of materials research (JMR)",
issn = "0884-2914",
publisher = "Materials Research Society : MRS",
number = "11",

}

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TY - JOUR

T1 - Film thickness dependent microstructural changes of thick copper metallizations upon thermal fatigue

AU - Bigl, Stephan

AU - Trost, Claus Othmar Wolfgang

AU - Wurster, Stefan

AU - Cordill, Megan J.

AU - Kiener, Daniel

PY - 2017/6/1

Y1 - 2017/6/1

N2 - With increasing performance requirements in power electronics, the necessity has emerged to investigate the thermo-mechanical behavior of thick Cu metallizations (≥5 μm). Cu films on rigid substrates in the range of 5-20 μm were thermally cycled between 170 and 400 °C by a fast laser device. Compared to the initial microstructures, a texture transition toward the {100} out-of-plane orientation with increasing film thickness was observed during thermo-mechanical cycling, along with an abnormal grain growth in the {100}-oriented grains and a gradual development of substructures in a crystallographic arrangement. Compared to the well-studied thin Cu film counterparts (≤5 μm), the surface damage showed a 1/h f dependency. Transition from an orientation independent (h f = 5 μm) to an orientation specific thermo-mechanical fatigue damage (h f = 10, 20 μm) was observed following a higher damager tolerance in {100} oriented grains.

AB - With increasing performance requirements in power electronics, the necessity has emerged to investigate the thermo-mechanical behavior of thick Cu metallizations (≥5 μm). Cu films on rigid substrates in the range of 5-20 μm were thermally cycled between 170 and 400 °C by a fast laser device. Compared to the initial microstructures, a texture transition toward the {100} out-of-plane orientation with increasing film thickness was observed during thermo-mechanical cycling, along with an abnormal grain growth in the {100}-oriented grains and a gradual development of substructures in a crystallographic arrangement. Compared to the well-studied thin Cu film counterparts (≤5 μm), the surface damage showed a 1/h f dependency. Transition from an orientation independent (h f = 5 μm) to an orientation specific thermo-mechanical fatigue damage (h f = 10, 20 μm) was observed following a higher damager tolerance in {100} oriented grains.

KW - fatigue

KW - texture

KW - thermal stresses

UR - http://www.scopus.com/inward/record.url?scp=85020723130&partnerID=8YFLogxK

U2 - 10.1557/jmr.2017.199

DO - 10.1557/jmr.2017.199

M3 - Article

AN - SCOPUS:85020723130

VL - 32.2017

SP - 2022

EP - 2034

JO - Journal of materials research (JMR)

JF - Journal of materials research (JMR)

SN - 0884-2914

IS - 11

ER -