Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography

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Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography. / Mühlbacher, Marlene; Mendez Martin, Francisca; Sartory, B. et al.
In: Thin solid films, Vol. 574, 2015, p. 103-109.

Research output: Contribution to journalArticleResearchpeer-review

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@article{c95ea5d22b1241fba346e985247def40,
title = "Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography",
author = "Marlene M{\"u}hlbacher and {Mendez Martin}, Francisca and B. Sartory and Nina Schalk and Jozef Keckes and J. Lu and L. Hultman and Christian Mitterer",
year = "2015",
doi = "10.1016/j.tsf2014.11.084",
language = "English",
volume = "574",
pages = "103--109",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography

AU - Mühlbacher, Marlene

AU - Mendez Martin, Francisca

AU - Sartory, B.

AU - Schalk, Nina

AU - Keckes, Jozef

AU - Lu, J.

AU - Hultman, L.

AU - Mitterer, Christian

PY - 2015

Y1 - 2015

U2 - 10.1016/j.tsf2014.11.084

DO - 10.1016/j.tsf2014.11.084

M3 - Article

VL - 574

SP - 103

EP - 109

JO - Thin solid films

JF - Thin solid films

SN - 0040-6090

ER -