Rostislav Daniel
Research output
- 2015
- Published
Microstructure, mechanical and optical properties of TiAlON coatings sputter-deposited with varying oxygen partial pressures
Schalk, N., Simonet Fotso, J. F. T., Holec, D., Fian, A., Jakopic, G., Terziyska, V. L., Daniel, R. & Mitterer, C., 2015, In: Journal of physics / D, Applied physics.Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructure-controlled depth gradients of mechanical properties in thin nanocrystalline films: Towards structure-property gradient functionalization
Daniel, R., Zeilinger, A., Schöberl, T., Sartory, B., Mitterer, C. & Keckes, J., 2015, In: Journal of applied physics. 117, 23, p. 235301-1-235301-12Research output: Contribution to journal › Article › Research › peer-review
- Published
Nitrogen atom shift and the structural change in chromium nitride
Wan, P., Zhang, Z., Holec, D., Daniel, R., Mitterer, C. & Duan, H., 2015, In: Acta materialia. 98, p. 119-127Research output: Contribution to journal › Article › Research › peer-review
- Published
Recent progress in advanced characterization methods for the development of hard coatings: From improved composition/microstructure/property relations to insights in degradation behavior
Mitterer, C., Mühlbacher, M., Zeilinger, A., Stefenelli, M., Daniel, R., Tkadletz, M., Schalk, N., Sartory, B. & Keckes, J., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Resolving depth evolution of microstructure and hardness in sputtered CrN film
Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79Research output: Contribution to journal › Article › Research › peer-review
- Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.Research output: Contribution to conference › Poster › Research › peer-review
- Published
The peculiarity of the metalceramic interface
Zhang, Z., Long, Y., Cazottes, S., Daniel, R., Mitterer, C. & Dehm, G., 2015, In: Scientific reports (London : Nature Publishing Group). p. 1-12Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film
Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31Research output: Contribution to journal › Article › Research › peer-review
- 2014
- E-pub ahead of print
Complementary ab initio and X-ray nanodiffraction studies of Ta2 O5
Hollerweger, R., Holec, D., Paulitsch, J., Bartosik, M., Daniel, R., Rachbauer, R., Polcik, P., Keckes, J., Krywka, C., Euchner, H. & Mayerhofer, P. H., 30 Oct 2014, (E-pub ahead of print) In: Acta materialia. 83.2015, 15 January, p. 276-284 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
Daniel, R., Jäger, E., Todt, J., Sartory, B., Mitterer, C. & Keckes, J., 28 May 2014, In: Journal of applied physics. 115, 20, 203507.Research output: Contribution to journal › Article › Research › peer-review