Rostislav Daniel

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Research output

  1. 2013
  2. Published

    Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film

    Bartosik, M., Daniel, R., Mitterer, C., Matko, I., Burghammer, M., Mayrhofer, P. H. & Keckes, J., 2013, In: Thin solid films. 542, p. 1-4

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Influence of Al and Si content on structure and mechanical properties of arc evaporated Al-Cr-Si-N thin films

    Tritremmel, C., Daniel, R., Lechthaler, M., Pocik, P. & Mitterer, C., 2013, In: Thin solid films. 534, p. 403-409

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Insights into the atomic and electronic structure triggered by ordered nitrogen vacancies in CrN

    Zhang, Z., Li, H., Daniel, R., Mitterer, C. & Dehm, G., 2013, In: Physical review : B, Condensed matter and materials physics. 87, p. 0141041-0141049

    Research output: Contribution to journal › Article › Research › peer-review

  5. Published

    Novel TiAlN nanostructured CVD coatings with superior oxidation resistance

    Keckes, J., Todt, J., Daniel, R., Mitterer, C., Köpf, A., Weißenbacher, R. & Pitonak, R., 2013.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Origins of microstructure and stress gradients in nanocrystalline thin films: The role of growth parameters and self-organization

    Daniel, R., Keckes, J., Matko, I., Burghammer, M. & Mitterer, C., 2013, In: Acta materialia. 61, p. 6255-6266

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Self-organized periodic soft-hard nanolamellae in polycrystalline TiAlN thin films

    Keckes, J., Daniel, R., Mitterer, C., Matko, I., Sartory, B., Köpf, A., Weißenbacher, R. & Pitonak, R., 2013, In: Thin solid films. 545, p. 29-32

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Transmission electron microscopy characterization of CrN films on MgO(001)

    Harzer, T. P., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2013, In: Thin solid films. 545, p. 154-160 7 p.

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films

    Kusiak, A., Martan, J., Battaglia, J.-L. & Daniel, R., 2013, In: Thermochimica Acta. 556, p. 1-5

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journal › Article › Research › peer-review

  11. 2014
  12. Published

    A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings

    Riedl, A., Daniel, R., Todt, J., Steffenelli, M., Holec, D., Sartory, B., Krywka, C., Müller, M., Mitterer, C. & Keckes, J., 2014, In: Surface & coatings technology. 257, p. 108-113

    Research output: Contribution to journal › Article › Research › peer-review

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