Rostislav Daniel

Research output

  1. 2015
  2. Published

    Resolving depth evolution of microstructure and hardness in sputtered CrN film

    Zeilinger, A., Daniel, R., Schöberl, T., Stefenelli, M., Sartory, B., Keckes, J. & Mitterer, C., 2015, In: Thin solid films. 581.2015, April, p. 75-79

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films

    Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.

    Research output: Contribution to conferencePosterResearchpeer-review

  4. Published

    The peculiarity of the metalceramic interface

    Zhang, Z., Long, Y., Cazottes, S., Daniel, R., Mitterer, C. & Dehm, G., 2015, In: Scientific reports (London : Nature Publishing Group). p. 1-12

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    X-ray nanodiffraction reveals stress distribution across an indented multilayered CrN-Cr thin film

    Steffenelli, M., Daniel, R., Ecker, W., Kiener, D., Todt, J., Zeilinger, A., Mitterer, C., Burghammer, M. & Keckes, J., 2015, In: Acta materialia. 85, p. 24-31

    Research output: Contribution to journalArticleResearchpeer-review

  6. 2016
  7. Published

    Advanced characterization methods for wear resistant hard coatings: A review on recent progress

    Tkadletz, M., Schalk, N., Daniel, R., Keckes, J., Czettl, C. & Mitterer, C., 2016, In: Surface & coatings technology. 285, p. 31-46 16 p.

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    Al-rich cubic Al0.8Ti0.2N coating with self-organized nano-lamellar microstructure: Thermal and mechanical properties

    Todt, J., Zalesak, J., Daniel, R., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Mitterer, C. & Keckes, J., 2016, In: Surface & coatings technology. 291, p. 89-93 5 p.

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published

    Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

    Zalesak, J., Todt, J., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Burghammer, M., Daniel, R. & Keckes, J., 2016, In: Journal of applied crystallography. 49, 6, p. 2217-2225 9 p.

    Research output: Contribution to journalArticleResearchpeer-review

  10. Published

    Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction

    Reisinger, M., Zalesak, J., Daniel, R., Tomberger, M., Weiss, J. K., Darbal, A. D., Petrenec, M., Zechner, J., Daumiller, I., Ecker, W., Sartory, B. & Keckes, J., 2016, In: Materials and Design. 106, p. 476-481 6 p.

    Research output: Contribution to journalArticleResearchpeer-review

  11. Published

    Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

    Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H. & Keckes, J., 2016, In: Acta materialia. 102, p. 212-219 8 p.

    Research output: Contribution to journalArticleResearchpeer-review

  12. Published
Previous 1...8 9 10 11 12 13 14 15 ...17 Next