Rostislav Daniel
Research output
- Published
X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Improvement of mechanical and tribological properties of arc evaporated Al-Cr-B-N hard coatings via multilayer architectures
Tritremmel, C., Daniel, R. & Mitterer, C., 2010, Proceedings 12th International Conference on Plasma Surface Engineering. p. 115-115Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Influence of Al and Si content on structure and mechanical properties of arc evaporated Al-Cr-Si-N thin films
Tritremmel, C., Daniel, R., Lechthaler, M., Pocik, P. & Mitterer, C., 2013, In: Thin solid films. 534, p. 403-409Research output: Contribution to journal › Article › Research › peer-review
- Published
Mechanical and tribological properties of Al - Ti - N/Al - Cr - B -N multilayer films synthesized by cathodic arc evaporation
Tritremmel, C., Daniel, R., Rudigier, H., Pocik, P. & Mitterer, C., 2014, In: Surface & coatings technology. 246, p. 57-63Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructure and mechanical properties of nanocrystalline Al-Cr-B-N thin films
Tritremmel, C., Daniel, R., Lechthaler, M., Rudigier, H., Polcik, P. & Mitterer, C., 2012, In: Surface & coatings technology. 213, p. 1-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Oxidation behavior of arc evaporated Al-Cr-Si-N thin films
Tritremmel, C., Daniel, R., Mitterer, C., Mayrhofer, P. H., Lechthaler, M. & Polcik, P., 2012, In: Journal of vacuum science & technology / A (JVST). 30, p. 061501-1-061501-6Research output: Contribution to journal › Article › Research › peer-review
- Published
Finite Element Simulation of the Effect of surface roughness on nanoindentation of thin films with spherical indenters
Walter, C., Antretter, T., Daniel, R. & Mitterer, C., 2007, In: Surface & coatings technology. 202, p. 1103-1107Research output: Contribution to journal › Article › Research › peer-review
- Published
FEM simulation of the effect of surface roughness on nanoindentation of thin films with a spherical indenter
Walter, C., Antretter, T., Daniel, R. & Mitterer, C., 2007, 34th International Conference on Metallurgical Coatings and Thin Films. p. 60-60Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Nitrogen atom shift and the structural change in chromium nitride
Wan, P., Zhang, Z., Holec, D., Daniel, R., Mitterer, C. & Duan, H., 2015, In: Acta materialia. 98, p. 119-127Research output: Contribution to journal › Article › Research › peer-review
- Published
Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film
Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H. & Keckes, J., 2016, In: Acta materialia. 102, p. 212-219 8 p.Research output: Contribution to journal › Article › Research › peer-review
