Maximilian Schiester
Research output
- 2024
- Published
fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy
Tkadletz, M., Schiester, M., Waldl, H., Schusser, G., Krause, M. & Schalk, N., Jun 2024, In: Materials Today Communications. 39.2024, June, 6 p., 108672.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Nanocomposite versus solid solution formation in the TiSiN system
Schalk, N., Moritz, Y., Nayak, G. K., Holec, D., Hugenschmidt, C., Burwitz, V. V., Mathes, L., Schiester, M., Saringer, C., Czettl, C., Pohler, M., Mitterer, C. & Tkadletz, M., 30 May 2024, (E-pub ahead of print) In: Acta materialia. 275.2024, 15 August, 10 p., 120063.Research output: Contribution to journal › Article › Research › peer-review
- Published
Influence of multiple detection events on compositional accuracy of TiN coatings in atom probe tomography
Schiester, M., Waldl, H., Hans, M., Thuvander, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 15 Feb 2024, In: Surface & coatings technology. 477.2024, 15 February, 11 p., 130318.Research output: Contribution to journal › Article › Research › peer-review
- Published
Advancements in elemental analysis of Ti(C,N) coatings using atom probe tomography
Schiester, M., 2024Research output: Thesis › Master's Thesis
- Published
Annealing activated substrate element diffusion and its influence on the microstructure and mechanical properties of CVD TiN/TiCN coatings
Konstantiniuk, F., Schiester, M., Tkadletz, M., Czettl, C. & Schalk, N., 2024, In: Surface & coatings technology. 488.2024, 30 July, 6 p., 131079.Research output: Contribution to journal › Article › Research › peer-review
- 2023
- Published
Is it meaningful to quantify vacancy concentrations of nanolamellar (Ti,Al)N thin films based on laser-assisted atom probe data?
Hans, M., Tkadletz, M., Primetzhofer, D., Waldl, H., Schiester, M., Bartosik, M., Czettl, C., Schalk, N., Mitterer, C. & Schneider, J. M., 25 Nov 2023, In: Surface & coatings technology. 473.2023, 25 November, 11 p., 130020.Research output: Contribution to journal › Article › Research › peer-review
- Published
Decomposition of CrN induced by laser-assisted atom probe tomography
Waldl, H., Hans, M., Schiester, M., Primetzhofer, D., Burtscher, M., Schalk, N. & Tkadletz, M., Apr 2023, In: Ultramicroscopy. 246.2023, April, 8 p., 113673.Research output: Contribution to journal › Article › Research › peer-review
- Published
Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing
Tkadletz, M., Waldl, H., Schiester, M., Lechner, A., Schusser, G., Krause, M. & Schalk, N., Apr 2023, In: Ultramicroscopy. 246.2023, April, 5 p., 113672.Research output: Contribution to journal › Article › Research › peer-review
- Published
Spatially resolved peak decomposition of 3D atom probe tomography datasets
Schiester, M., Konstantiniuk, F., Schalk, N. & Tkadletz, M., 2023.Research output: Contribution to conference › Poster › Research