Maximilian Schiester
1 - 10 out of 13Page size: 10
Research output
- 2025
- Published
Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study
Schiester, M., Waldl, H., Rice, K. P., Hans, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 17 Jan 2025, In: Ultramicroscopy. 270.2025, April, 10 p., 114105.Research output: Contribution to journal › Article › Research › peer-review
- 2024
- Published
Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited Film
Cicek, A., Knabl, F., Schiester, M., Waldl, H., Rafailovic, L., Tkadletz, M. & Mitterer, C., 30 Dec 2024, In: Nanomaterials. 15.2025, 1, 13 p., 43.Research output: Contribution to journal › Article › Research › peer-review
- Published
State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements
Tkadletz, M., Schiester, M., Renk, O. & Schalk, N., 24 Jul 2024, In: Microscopy and microanalysis. 30.2024, Supplement 1, p. 89-90 2 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy
Tkadletz, M., Schiester, M., Waldl, H., Schusser, G., Krause, M. & Schalk, N., Jun 2024, In: Materials Today Communications. 39.2024, June, 6 p., 108672.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Nanocomposite versus solid solution formation in the TiSiN system
Schalk, N., Moritz, Y., Nayak, G. K., Holec, D., Hugenschmidt, C., Burwitz, V. V., Mathes, L., Schiester, M., Saringer, C., Czettl, C., Pohler, M., Mitterer, C. & Tkadletz, M., 30 May 2024, (E-pub ahead of print) In: Acta materialia. 275.2024, 15 August, 10 p., 120063.Research output: Contribution to journal › Article › Research › peer-review
- Published
Influence of multiple detection events on compositional accuracy of TiN coatings in atom probe tomography
Schiester, M., Waldl, H., Hans, M., Thuvander, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 15 Feb 2024, In: Surface & coatings technology. 477.2024, 15 February, 11 p., 130318.Research output: Contribution to journal › Article › Research › peer-review
- Published
Advancements in elemental analysis of Ti(C,N) coatings using atom probe tomography
Schiester, M., 2024Research output: Thesis › Master's Thesis
- Published
Annealing activated substrate element diffusion and its influence on the microstructure and mechanical properties of CVD TiN/TiCN coatings
Konstantiniuk, F., Schiester, M., Tkadletz, M., Czettl, C. & Schalk, N., 2024, In: Surface & coatings technology. 488.2024, 30 July, 6 p., 131079.Research output: Contribution to journal › Article › Research › peer-review
- Published
Chemical vapor deposited TiCN/TiC multilayer coatings: On the interplay between coating architecture and mechanical properties
Kainz, C., Tkadletz, M., Maier-Kiener, V., Völker, B., Burtscher, M., Waldl, H., Schiester, M., Thurner, J., Czettl, C. & Schalk, N., 2024, In: International journal of refractory metals & hard materials. 2024, 125, p. 1-6Research output: Contribution to journal › Article › Research › peer-review
- 2023
- Published
Is it meaningful to quantify vacancy concentrations of nanolamellar (Ti,Al)N thin films based on laser-assisted atom probe data?
Hans, M., Tkadletz, M., Primetzhofer, D., Waldl, H., Schiester, M., Bartosik, M., Czettl, C., Schalk, N., Mitterer, C. & Schneider, J. M., 25 Nov 2023, In: Surface & coatings technology. 473.2023, 25 November, 11 p., 130020.Research output: Contribution to journal › Article › Research › peer-review
