Maximilian Schiester

Research output

  1. 2024
  2. Published

    Influence of multiple detection events on compositional accuracy of TiN coatings in atom probe tomography

    Schiester, M., Waldl, H., Hans, M., Thuvander, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 15 Feb 2024, In: Surface & coatings technology. 477.2024, 15 February, 11 p., 130318.

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy

    Tkadletz, M., Schiester, M., Waldl, H., Schusser, G., Krause, M. & Schalk, N., 2024, In: Materials Today Communications. 2024, 39, p. 1-6

    Research output: Contribution to journalArticleResearchpeer-review

  4. 2023
  5. Published

    Is it meaningful to quantify vacancy concentrations of nanolamellar (Ti,Al)N thin films based on laser-assisted atom probe data?

    Hans, M., Tkadletz, M., Primetzhofer, D., Waldl, H., Schiester, M., Bartosik, M., Czettl, C., Schalk, N., Mitterer, C. & Schneider, J. M., 25 Nov 2023, In: Surface & coatings technology. 473.2023, 25 November, 11 p., 130020.

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    Decomposition of CrN induced by laser-assisted atom probe tomography

    Waldl, H., Hans, M., Schiester, M., Primetzhofer, D., Burtscher, M., Schalk, N. & Tkadletz, M., Apr 2023, In: Ultramicroscopy. 246.2023, April, 8 p., 113673.

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing

    Tkadletz, M., Waldl, H., Schiester, M., Lechner, A., Schusser, G., Krause, M. & Schalk, N., Apr 2023, In: Ultramicroscopy. 246.2023, April, 5 p., 113672.

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published