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Maximilian Schiester
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Chair of Functional Materials and Materials Systems (425)
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Latest Research Output
Influence of multiple detection events on compositional accuracy of TiN coatings in atom probe tomography
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peer-review
fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy
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peer-review
Is it meaningful to quantify vacancy concentrations of nanolamellar (Ti,Al)N thin films based on laser-assisted atom probe data?
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peer-review
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