Matthias Bartosik
Research output
- 2016
- Published
Interface controlled microstructure evolution in nanolayered thin films
Bartosik, M., Keckes, J., Persson, P. O. Å., Riedl, H. & Mayrhofer, P. H., 2016, In: Scripta materialia. 123, p. 13-16 4 p.Research output: Contribution to journal › Article › Research › peer-review
- 2014
- Published
Macroscopic fracture behaviour of CrN hard coatings evaluated by X-ray diffraction coupled with four-point bending
Stefenelli, M., Riedl, A., Todt, J., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 1 Jan 2014, Materials Science Forum. Vol. 768-769. p. 272-279 8 p. (Materials Science Forum; vol. 768-769).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- 2013
- Published
Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
Bartosik, M., Daniel, R., Mitterer, C., Matko, I., Burghammer, M., Mayrhofer, P. H. & Keckes, J., 2013, In: Thin solid films. 542, p. 1-4Research output: Contribution to journal › Article › Research › peer-review
- 2012
- Published
Lateral gradients of phases, residual stress and hardness in a laser heated Ti0.52Al0.48N coating on hard metal
Bartosik, M., Daniel, R., Zhang, Z., Deluca, M., Ecker, W., Steffenelli, M., Klaus, M., Genzel, C., Stefenelli, M., Mitterer, C. & Keckes, J., 2012, In: Surface & coatings technology. 206, p. 4502-4510 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Non-homogeneous structural and mechanical properties of nanocrystalline thin films characterized by advanced X-ray diffraction techniques
Bartosik, M., 2012, 134 p.Research output: Thesis › Doctoral Thesis
- Published
Thermally treated hard coatings characterized by XRD coupled with four-point bending
Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751Research output: Contribution to journal › Article › Research › peer-review
- 2011
- Published
Size effect of thermal expansion and thermal/intrinsic stresses in nanostructured thin films: Experiment and model
Daniel, R., Holec, D., Bartosik, M., Keckes, J. & Mitterer, C., 2011, In: Acta materialia. 59, p. 6631-6645Research output: Contribution to journal › Article › Research › peer-review
- 2010
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Thermally-induced formation of hexagonal AlN in AlCrN hard coatings on sapphire: Orientation relationships and residual stresses
Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2010, In: Surface & coatings technology. 205, p. 1320-1323Research output: Contribution to journal › Article › Research › peer-review