Markus Kratzer
Research output
- 2011
- Published
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- 2010
- Published
A theoretical study of Zn adsorption and desorption on a Pd(111) substrate
Koch, H. P., Bako, I., Weirum, G., Kratzer, M. & Schennach, R., 2010, In: Surface Science. 604, p. 926-931Research output: Contribution to journal › Article › Research › peer-review
- Published
AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2
Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Growth of para-hexaphenyl (6P) on silicon oxide by hot wall epitaxy
Kratzer, M., Shen, Q. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Growth of para-hexaphenyl (p6P) on SiO2 by hot wall epitaxy
Kratzer, M., Shen, Q. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10Research output: Contribution to journal › Article › Research › peer-review
