Markus Kratzer

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Research output

  1. Published

    Piezoelectric Properties of Zinc Oxide Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition

    Abu Ali, T., Pilz, J., Schäffner, P., Kratzer, M., Teichert, C., Stadlober, B. & Coclite, A. M., Nov 2020, In: Physica Status Solidi / A, Applications and Materials Science. 217, 21, 2000319.

    Research output: Contribution to journal › Article › Research › peer-review

  2. Published

    Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

    Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Combined C-AFM/PFM investigations of ZnO nanorods

    Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7

    Research output: Contribution to journal › Article › Research › peer-review

  6. Published

    Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration

    Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Photoresponse from single upright standing ZnO nanorods explored by photoconductive atomic force microscopy

    Beinik, I., Kratzer, M., Teichert, C., Wachauer, A., Wang, L., Pyriatinsky, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurisic, A., 2013, In: Beilstein journal of nanotechnology . 4, p. 208-217

    Research output: Contribution to journal › Article › Research › peer-review

  8. Published

    Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Piryatinski, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F., Djurišić, A. B. & Teichert, C., 17 Apr 2013, In: Beilstein journal of nanotechnology. 4, 1, p. 208-217 10 p.

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

    Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurišić, A. B., 1 Oct 2012, In: Journal of applied physics. 112.2012, 7, 1 p., 079903.

    Research output: Contribution to journal › Comment/debate › peer-review

  10. Published

    Growth of ultra-thin para-hexaphenyl layers on atomically-flat TiO2(110) surfaces

    Belza, W., Szajna, K., Wrana, D., Kratzer, M., Teichert, C. & Krok, F., 25 Feb 2018.

    Research output: Contribution to conference › Poster › Research › peer-review

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