Karl Christian Teichert
Research output
- 2009
- Published
Ehrlich Schwoebel barriers in organic thin film growth
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Elektrische Eigenschaften von Dünnfilmen auf der Nanoskala
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Exploring fundamental growth morphologies in organic thin film systems
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Hierarchy of adhesion forces in patterns of photoreactive surface layers
Hlawacek, G., Shen, Q., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2009, In: Journal of chemical physics (The journal of chemical physics). 130, p. 44703-1-44703-5Research output: Contribution to journal › Article › Research › peer-review
- Published
High Resolution RBS on High-k Dielectrics
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
Teichert, C. (ed.), 2009, Eigenverlag.Research output: Book/Report › Anthology › Research
- Published
Ion beam sputtered nanostructured semiconductor surfaces as templates for nanomagnet arrays
Teichert, C., de Miguel, J. J. & Bobek, T., 2009, In: Journal of physics (Condensed matter). 21, p. 224025-224033Research output: Contribution to journal › Article › Research › peer-review
- Published
Ion-bombardment induced morphology change of device related SiGe multilayer heterostructures
Hofer, C., Teichert, C., Werner, J., Lyutovich, K. & Kasper, E., 2009, In: Applied surface science. 256, p. 267-273Research output: Contribution to journal › Article › Research › peer-review
- Published
Kontaktwinkelmessung an UHPC Oberflächen
Schmied, F., Gürkan, N. & Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Morphological properties of three dimensional Ge nanoclusters grown on SiOx (x
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review