Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

Research output: Contribution to conferencePosterResearchpeer-review

Authors

  • Heinz-Georg Flesch
  • Thomas Potocar
  • Roland Resel
  • Adolf Winkler

Organisational units

Details

Translated title of the contributionDomain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Original languageEnglish
Publication statusPublished - 2009
Event59. Jahrestagung der Österreichischen Physikalischen Gesellschaft - Innsbruck, Austria
Duration: 2 Sept 20094 Sept 2009

Conference

Conference59. Jahrestagung der Österreichischen Physikalischen Gesellschaft
CityInnsbruck, Austria
Period2/09/094/09/09