Karl Christian Teichert
Research output
- Published
Mechanisms for self-assembling topography formation in low-temperature vacuum deposition of inorganic coatings on polymer surfaces
Lackner, J., Waldhauser, W., Teichert, C. & Schmied, F., 2010, In: Bulletin of the Polish Academy of Sciences / Technical sciences. 58, p. 281-294Research output: Contribution to journal › Article › Research › peer-review
- Published
Self-assembling (nano-)wrinkling topography formation in low-temperature vacuum deposition on soft polymer surfaces
Lackner, J., Waldhauser, W., Hartmann, P., Miskovics, O., Schmied, F., Teichert, C. & Schöberl, T., 2012, In: Thin solid films. 520, p. 2833-2840Research output: Contribution to journal › Article › Research › peer-review
- Published
Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
Kremmer, S., Wurmbauer, H., Andreev, A., Teichert, C., Tallarida, G., Spiga, S., Wiemer, C. & Fanciulli, M., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Modification and characterization of thin silicon gate oxides using conducting atomic force microscopy
Kremmer, S., Peissl, S., Teichert, C., Kuchar, F. & Hofer, C., 2003, In: Materials science and engineering B (Solid-state materials for advanced technology). 102, p. 88-93Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of silicon gate oxides by conducting atomic-force microscopy
Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172Research output: Contribution to journal › Article › Research › peer-review
- Published
AFM Charakterisierung von LSC und LNO Proben
Kreiml, P. & Teichert, C., 2014Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Morphological investigations of viscose fibers by atomic force microscopy
Kreiml, P., Ganser, C., Schennach, R. & Teichert, C., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
The role of the probe tip material in distinguishing p- and n-type domains in bulk heterojunction solar cells by atomic force microscopy based methods
Kratzer, M., Dimitriev, O. P., Fedoryak, A. N., Osipyonok, N. M., Balaz, P., Balaz, M., Tesinsky, M. & Teichert, C., 14 May 2019, In: Journal of applied physics. 125.2019, 18, 185305.Research output: Contribution to journal › Article › Research › peer-review
- Published
Growth of para-hexaphenyl (6P) on silicon oxide by hot wall epitaxy
Kratzer, M., Shen, Q. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Island shape anisotropy in organic thin film growth induced by ion-beam irradiated rippled surfaces
Kratzer, M., Wrana, D., Szajna, K., Krok, F. & Teichert, C., 2014, In: Physical chemistry, chemical physics : PCCP. 16, 47, p. 26112-26118Research output: Contribution to journal › Article › Research › peer-review