Jozef Keckes
Research output
- Published
Thermally-induced stresses in thin aluminum layers grown on silicon
Eiper, E., Resel, R., Eisenmenger-Sittner, C., Hafok, M. & Keckes, J., 2004, In: Powder diffraction. p. 74-76Research output: Contribution to journal › Article › Research › peer-review
- Published
Anisotropic intrinsic and extrinsic stresses in gan thin film on LiAlO2 (100)
Eiper, E., Gerlach, J. W., Rauschenbach, B. & Keckes, J., 2004.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Temperature dependence of residual stresses in thin films determined by the substrate
Eiper, E., Martinschitz, K.-J., Köstenbauer, H., Massl, S. & Keckes, J., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Temperature dependence of residual stresses in thin films determined by the substrate curvatur method
Eiper, E., Martinschitz, K.-J., Köstenbauer, H., Massl, S. & Keckes, J., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Size effect in metallic thin films characterized by low-temperature X-ray diffraction
Eiper, E., Martinschitz, K. J., Dehm, G. & Keckes, J., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Anisotropic intrinsic and extrinsic stresses in epitaxial wurzitic GaN thin film on γ-LiAlO2 (100)
Eiper, E., Hofmann, A., Gerlach, J. W., Rauschenbach, B. & Keckes, J., 2005, In: Journal of crystal growth. 284, p. 561-566Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods
Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Eiper, E., Martinschitz, K.-J. & Keckes, J., 2006, In: Powder diffraction. 21, p. 25-29Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Eiper, E., Martinschitz, K.-J. & Keckes, J., 2005, In: Powder diffraction. 20, p. 1-5Research output: Contribution to journal › Article › Research › peer-review
- Published
In situ analysis of the effect of high heating rates and initial microstructure on the formation and homogeneity of austenite
Eggbauer, A., Lukas, M., Ressel, G., Prevedel, P., Mendez Martin, F., Keckes, J., Stark, A. & Ebner, R., 22 Mar 2019, In: Journal of materials science. 54.2019, 12, p. 9197-9212 16 p.Research output: Contribution to journal › Article › Research › peer-review
