Jozef Keckes
Research output
- Published
Modification of wetting of copper (Cu) on carbon (C) by plasma treatment and molybdenum (Mo)interlayers
Eisenmenger-Sittner, C., Schrank, C., Neubauer, E., Eiper, E. & Keckes, J., 2006, In: Applied surface science. 252, p. 5343-5346Research output: Contribution to journal › Article › Research › peer-review
- Published
Mono-textured nanocrystalline thin films with pronounced stress-gradients: On the role of grain boundaries in the stress evolution
Daniel, R., Jäger, E., Todt, J., Sartory, B., Mitterer, C. & Keckes, J., 28 May 2014, In: Journal of applied physics. 115, 20, 203507.Research output: Contribution to journal › Article › Research › peer-review
- Published
Multimethod cross-sectional characterization approaching the limits of diamond monophase multilayers
Meindlhumer, M., Grau, J., Sternschulte, H., Halahovets, Y., Siffalovic, P., Burghammer, M., Steinmüller-Nethl, D. & Keckes, J., 13 May 2024, In: Materials characterization. 212.2024, June, 15 p., 113973.Research output: Contribution to journal › Article › Research › peer-review
- Published
Multi-scale interface design of strong and damage resistant hierarchical nanostructured materials
Daniel, R., Meindlhumer, M., Zalesak, J., Baumegger, W., Todt, J., Ziegelwanger, T., Keckes, J., Mitterer, C. & Keckes, J., Nov 2020, In: Materials and Design. 196, November, p. 1-11 109169.Research output: Contribution to journal › Article › Research › peer-review
- Published
Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs
Karner, S., Blank, O., Rösch, M., Zalesak, J., Keckes, J. & Gammer, C., 2022, In: Microelectronic engineering. 264.2022, 15 August, 111870.Research output: Contribution to journal › Article › Research › peer-review
- Published
Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
Bartosik, M., Daniel, R., Mitterer, C., Schoeder, S., Burghammer, M. & Keckes, J., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
Keckes, J., Daniel, R., Bartosik, M., Mitterer, C., Schoeder, S. & Burghammer, M., 2011, Proceeding of International Conference on Metallurgical Coatings and Thin Films. p. 55-55Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G., Schoeder, S. & Burghammer, M., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanoindentation and microbending analyses of glassy and crystalline Zr([sbnd]Hf)[sbnd]Cu thin-film alloys
Haviar, S., Kozák, T., Meindlhumer, M., Zítek, M., Opatová, K., Kučerová, L., Keckes, J. & Zeman, P., 15 Oct 2020, In: Surface and Coatings Technology. 399, 126139.Research output: Contribution to journal › Article › Research › peer-review
- Published
Nano-Indentation of SiC and Si3N4/SiC ceramic materials
Balog, M., Sajgalík, P., Lencés, Z., Hnatko, M., Keckes, J., Huang, J. L., Janega, J. & Horvathova, R., 2005, In: Materials Science Forum . 290, p. 272-275Research output: Contribution to journal › Article › Research › peer-review
