Jozef Keckes
Research output
- Published
20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates
Ziegelwanger, T., Reisinger, M., Vedad, B., Hlushko, K., Van Petegem, S., Todt, J., Meindlhumer, M. & Keckes, J., 31 Jan 2025, In: Materials and Design. 251.2025, March, 9 p., 113664.Research output: Contribution to journal › Article › Research › peer-review
- Published
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873Research output: Contribution to journal › Article › Research › peer-review
- Published
3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology
Vaxelaire, N., Labat, S., Chamard, V., Thomas, O., Jaques, V., Picca, F., Ravy, S., Kirchlechner, C. & Keckes, J., 2010, In: Nuclear instruments & methods in physics research / B Beam interactions with materials and atoms. p. 388-393Research output: Contribution to journal › Article › Research › peer-review
- Published
Ab initio molecular dynamics model for density, elastic properties and short range order of Co–Fe–Ta–B metallic glass thin films
Hostert, C., Music, D., Bednarcik, J., Keckes, J., Kapaklis, V., Hjövarsson, B. & Schneider, J. M., 2011, In: European physical journal B, Condensed matter physics : EPJ B. p. 4754011-4754017Research output: Contribution to journal › Article › Research › peer-review
- Published
A cantilever method to determine depth profiles of residual stresses on the nanoscale
Massl, S., Keckes, J. & Pippan, R., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Riedl, A., Daniel, R., Todt, J., Steffenelli, M., Holec, D., Sartory, B., Krywka, C., Müller, M., Mitterer, C. & Keckes, J., 2014, In: Surface & coatings technology. 257, p. 108-113Research output: Contribution to journal › Article › Research › peer-review
- Published
Actual versus apparent within cell wall variability of nanoindentation results from wood cell walls related to cellulose microfibril angle
Konnerth, J., Gierlinger, N., Keckes, J. & Gindl, W., 2009, In: Journal of materials science. 44, p. 4399-4406Research output: Contribution to journal › Article › Research › peer-review
- Published
A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
Massl, S., Keckes, J. & Pippan, R., 2007, In: Acta materialia. 55, p. 4835-4844Research output: Contribution to journal › Article › Research › peer-review
- Published
Advanced characterization methods for wear resistant hard coatings: A review on recent progress
Tkadletz, M., Schalk, N., Daniel, R., Keckes, J., Czettl, C. & Mitterer, C., 2016, In: Surface & coatings technology. 285, p. 31-46 16 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Advanced cross-sectional characterization of hard coatings
Tkadletz, M., Mitterer, C., Keckes, J., Rebelo De Figueiredo, M., Hosemann, P., Burghammer, M., Sartory, B. & Czettl, C., 2013.Research output: Contribution to conference › Poster › Research › peer-review
