Jakub Zalesak
(Former)
Research output
- Published
Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction
Hlushko, K., Mackova, A., Zalesak, J., Burghammer, M., Davydok, A., Krywka, C., Daniel, R., Keckes, J. & Todt, J., 7 Feb 2021, In: Thin solid films. 722.2021, 31 March, 6 p., 138571.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Lignin-based multiwall carbon nanotubes
Gindl-Altmutter, W., Köhnke, J., Unterweger, C., Gierlinger, N., Keckes, J., Zalesak, J. & Rojas, O. J., 22 Mar 2019, (E-pub ahead of print) In: Composites Part A: Applied Science and Manufacturing. 121.2019, June, p. 175-179 5 p.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Mapping strain across Co80Ta7B13 / Co62Ta6B32 glassy interfaces
Evertz, S., Zalesak, J., Hans, M., Jansen, H. C., Keckes, J., Sheng, H., Eckert, J. & Gammer, C., 15 Sept 2023, (E-pub ahead of print) In: Materials and Design. 234.2023, October, 7 p., 112327.Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructural design: a successful strategy for fracture toughness enhancement of hard coatings
Daniel, R., Zalesak, J., Mitterer, C., Sartory, B., Meindlhumer, M. & Keckes, J., 2015.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Microstructural Effects on the Interfacial Adhesion of Nanometer-Thick Cu Films on Glass Substrates: Implications for Microelectronic Devices
Lassnig, A., Terziyska, V. L., Zalesak, J., Jörg, T., Toebbens, D. M., Griesser, T., Mitterer, C., Pippan, R. & Cordill, M. J., 28 Dec 2020, In: ACS Applied Nano Materials. 4.2021, 1, p. 61-70 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructure-related depth-gradients of mechanical properties in thin nanocrystalline films
Daniel, R., Zalesak, J., Mitterer, C., Riedl, A., Sartory, B., Keckes, J. & Schöberl, T., 2014.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs
Karner, S., Blank, O., Rösch, M., Zalesak, J., Keckes, J. & Gammer, C., 2022, In: Microelectronic engineering. 264.2022, 15 August, 111870.Research output: Contribution to journal › Article › Research › peer-review
- Published
On the stability of the Higher Manganese Silicides
Allam, A., Nunes, C. A., Zalesak, J. & Record, M. C., 25 Jan 2012, In: Journal of alloys and compounds. 512, 1, p. 278-281 4 p.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Peculiarity of self-assembled cubic nanolamellae in the TiN/AlN system: Epitaxial self-stabilization by element deficiency/excess
Zalesak, J., Holec, D., Matko, I., Petrenec, M., Sartory, B., Koutna, N., Daniel, R., Pitonak, R. & Keckes, J., 5 Apr 2017, (E-pub ahead of print) In: Acta materialia. 131.2017, 1 June, p. 391-399 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Probing the composition dependence of residual stress distribution in tungsten-titanium nanocrystalline thin films
Sinojiya, R. J., Paulachan, P., Falah Chamasemani, F., Bodlos, R., Hammer, R., Zalesak, J., Reisinger, M., Scheiber, D., Keckes, J., Romaner, L. & Brunner, R., 15 Feb 2023, In: Communications materials. 2023, 4, 12 p., 11.Research output: Contribution to journal › Article › Research › peer-review
