Igor Beinik
(Former)
Research output
- Published
AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2
Kratzer, M., Klima, S., Beinik, I., Shen, Q., Lugstein, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of single ZnO nanorods by conductive atomic force microscopy
Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G. & Anwand, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Spectroscopy of Defects in Epitaxially Grown Para-sexiphenyl Nanostructures
Kadashchuk, A., Skryshevski, Y., Beinik, I., Teichert, C., Hernandez-Sosa, G., Sitter, H., Andreev, A., Frank, P. & Winkler, A., 2009, EMRS Symposium O. p. 121-125Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Origin of the low-energy emission band in epitaxially grown para-sexiphenyl nanocrystallites
Kadashchuk, A., Schols, S., Heremans, P., Skryshevski, Y., Piryantinski, Y., Beinik, I., Teichert, C., Hernandez-Sosa, G., Sitter, H., Andreev, A., Frank, P. & Winkler, A., 2009, In: Journal of chemical physics (The journal of chemical physics). 130, p. 084901-1-084901-9Research output: Contribution to journal › Article › Research › peer-review
- Published
Spectroscopy of defects in epitaxially grown para-sexiphenyl nanostructures
Kadashchuk, A., Schols, S., Skryshevski, Y., Beinik, I., Teichert, C., Hernandez-Sosa, G., Sitter, H., Andreev, A., Frank, P. & Winkler, A., 2009, Interface Controlled Organic Thin Films. p. 121-125 (Springer proceedings in physics; vol. 129).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Beinik, I., Galiana, B., Kratzer, M., Teichert, C., Rey-Stolle, I., Algora, C. & Tejedor, P., 2010, In: Journal of vacuum science & technology / B (JVST). 28, p. C5G5-C5G10Research output: Contribution to journal › Article › Research › peer-review
- Published
Combined C-AFM/PFM investigations of ZnO nanorods
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
