Characterization of single ZnO nanorods by conductive atomic force microscopy

Research output: Contribution to conferencePosterResearchpeer-review

Authors

  • Lin Wang
  • Gerhard Brauer
  • Wolfgang Anwand

Organisational units

Details

Translated title of the contributionCharacterization of single ZnO nanorods by conductive atomic force microscopy
Original languageEnglish
Publication statusPublished - 2009
EventÖPG Jahrestagung - Innsbruck
Duration: 2 Sept 20094 Sept 2009

Conference

ConferenceÖPG Jahrestagung
CityInnsbruck
Period2/09/094/09/09